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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 19 — Sep. 22, 2003
  • pp: 2303–2314

Phase-sensitive imaging and phase tomography using X-ray interferometers

Atsushi Momose  »View Author Affiliations


Optics Express, Vol. 11, Issue 19, pp. 2303-2314 (2003)
http://dx.doi.org/10.1364/OE.11.002303


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Abstract

X-ray interferometry for imaging applications is discussed with a review of X-ray interferometric imaging activities reported to date. Phase measurement and phase tomography based on X-ray interferometry are also presented. Finally the advantage of X-ray interferometric imaging in comparison with other phase-sensitive X-ray imaging methods is discussed.

© 2003 Optical Society of America

OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
Focus Issue: Coherent x-ray optics

History
Original Manuscript: July 29, 2003
Revised Manuscript: September 12, 2003
Published: September 22, 2003

Citation
Atsushi Momose, "Phase-sensitive imaging and phase tomography using X-ray interferometers," Opt. Express 11, 2303-2314 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-19-2303


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