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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 19 — Sep. 22, 2003
  • pp: 2344–2353

Coherent X-ray diffractive imaging: applications and limitations

S. Marchesini, H. N. Chapman, S. P. Hau-Riege, R. A. London, A. Szoke, H. He, M. R. Howells, H. Padmore, R. Rosen, J. C. H. Spence, and U. Weierstall  »View Author Affiliations


Optics Express, Vol. 11, Issue 19, pp. 2344-2353 (2003)
http://dx.doi.org/10.1364/OE.11.002344


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Abstract

The inversion of a diffraction pattern offers aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems, the only limitation being radiation damage. We review our recent experimental results, in which X-ray images were reconstructed from the diffraction pattern alone. A preliminary analysis of the radiation dose needed for CXDI imaging and the dose tolerance of frozen-hydrated life-science samples suggests that 3D tomography at a resolution of about 10 nm may be possible. In material science, where samples are less sensitive to radiation damage, we expect CXDI to be able to achieve 1 to 2 nm resolution using modern x-ray synchrotron sources. For higher resolution imaging of biological material, strategies based on fast-pulse illumination from proposed x-ray free-electron laser sources, can be considered as described in Neutze et al. Nature 406, 752–757 (2000).

© 2003 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(110.7440) Imaging systems : X-ray imaging
(170.6900) Medical optics and biotechnology : Three-dimensional microscopy

ToC Category:
Focus Issue: Coherent x-ray optics

History
Original Manuscript: August 11, 2003
Revised Manuscript: September 9, 2003
Published: September 22, 2003

Citation
S. Marchesini, H. Chapman, S. Hau-Riege, R. London, A. Szoke, H. He, M. Howells, H. Padmore, R. Rosen, J. Spence, and U. Weierstall, "Coherent X-ray diffractive imaging: applications and limitations," Opt. Express 11, 2344-2353 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-19-2344


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