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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 20 — Oct. 6, 2003
  • pp: 2497–2501

Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage

Annelise During, Mireille Commandré, Caroline Fossati, Bertrand Bertussi, Jean-Yves Natoli, Jean-Luc Rullier, Hervé Bercegol, and Philippe Bouchut  »View Author Affiliations


Optics Express, Vol. 11, Issue 20, pp. 2497-2501 (2003)
http://dx.doi.org/10.1364/OE.11.002497


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Abstract

An integrated setup allowing high resolution photothermal microscopy and laser damage measurements at the same wavelength has been implemented. The microscope is based on photothermal deflection of a transmitted probe beam : the probe beam (633 nm wavelength) and the CW pump beam (1.06 µm wavelength) are collinear and focused through the same objective. In-situ laser irradiation tests are performed thanks to a pulsed beam (1.06 µm wavelength and 6 nanosecond pulse). We describe this new facility and show that it is well adapted to the detection of sub-micronic absorbing defects, that, once located, can be precisely aimed and irradiated. Photothermal mappings are performed before and after shot, on metallic inclusions in dielectric. Results obtained on gold inclusions of about 600 nm in diameter embedded in silica are presented.

© 2003 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(140.3330) Lasers and laser optics : Laser damage
(300.1030) Spectroscopy : Absorption
(350.5340) Other areas of optics : Photothermal effects

ToC Category:
Research Papers

History
Original Manuscript: September 4, 2003
Revised Manuscript: September 16, 2003
Published: October 6, 2003

Citation
Annelise During, Mireille Commandre, Caroline Fossati, Bertrand Bertussi, Jean-Yves Natoli, Jean-Luc Rullier, Herve Bercegol, and Philippe Bouchut, "Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage," Opt. Express 11, 2497-2501 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-20-2497


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