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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 21 — Oct. 20, 2003
  • pp: 2654–2665

Determining the influential depth for surface reflectance of sediment by BRDF measurements

H. Zhang, K. J. Voss, and R. P. Reid  »View Author Affiliations

Optics Express, Vol. 11, Issue 21, pp. 2654-2665 (2003)

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We measure the Bi-directional reflectance distribution function (BRDF) of ooid sand layers with three particle size distributions (0.5–1mm, 0.25–0.5mm and 0.125–0.25mm) and layer thicknesses on a reflecting mirror to determine the influential depth in the optical region at wavelengths of 658 nm (red), 570 nm (green) and 457 nm (blue). The hemispherical reflectance (albedo) was used as an indicator of BRDF changes between different layers. Measurements are carried out on both dry and water wetted grains. The results indicate that for both dry and wet and all size distributions, the influential depth is at most 2mm.

© 2003 Optical Society of America

OCIS Codes
(010.4450) Atmospheric and oceanic optics : Oceanic optics
(030.5620) Coherence and statistical optics : Radiative transfer
(280.0280) Remote sensing and sensors : Remote sensing and sensors
(290.5850) Scattering : Scattering, particles
(300.0300) Spectroscopy : Spectroscopy
(350.4990) Other areas of optics : Particles

ToC Category:
Research Papers

Original Manuscript: August 6, 2003
Revised Manuscript: October 1, 2003
Published: October 20, 2003

H. Zhang, K. Voss, and R. Reid, "Determining the influential depth for surface reflectance of sediment by BRDF measurements," Opt. Express 11, 2654-2665 (2003)

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