Experimental study of the free spectral range (FSR) in FPI with a small plate gap
Optics Express, Vol. 11, Issue 23, pp. 3147-3152 (2003)
http://dx.doi.org/10.1364/OE.11.003147
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Abstract
In this paper we investigate the variation of free spectral range (FSR) for the Fabry-Perot interferometer (FPI) consisting of mirrors with phase shift dispersion. The reflection phase shift on a mirror has been calculated employing the Transfer-Matrix Method and the values of FSR have been calculated under the condition of normal incidence of light beam. Fabry-Perot (FP) cavities have been fabricated employing bulk micromachining technology, and silicon wafers coated with multilayer dielectric films were used as mirrors. FSR of these FP cavities have been experimentally measured. The experimental data match the calculated results very well. The conclusion is that FSR shortening effect must be taken into account for the FPIs with a small plate gap, as the finesse and the tunable range of tunable FPI can be affected by the shortening effect greatly.
© 2003 Optical Society of America
OCIS Codes
(050.2230) Diffraction and gratings : Fabry-Perot
(050.5080) Diffraction and gratings : Phase shift
(260.2030) Physical optics : Dispersion
ToC Category:
Research Papers
History
Original Manuscript: September 23, 2003
Revised Manuscript: October 31, 2003
Published: November 17, 2003
Citation
Min Xiang, Y. Cai, Y. Wu, J. Yang, and Y. Wang, "Experimental study of the free spectral range (FSR) in FPI with a small plate gap," Opt. Express 11, 3147-3152 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-23-3147
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References
- G. Hernandez, �??A high luminosity spectrometer for night airglow studies,�?? Appl. Opt. 9, 1225-1227 (1970). 2. P. B. Hays and R. G. Roble, �??A technique for recovering Doppler line profiles from Fabry-Perot interferometer fringes of very low intensity,�?? Appl. Opt. 10, 193-200 (1971). [CrossRef] [PubMed]
- P. B. Hays and R. G. Roble, �??A technique for recovering Doppler line profiles from Fabry-Perot interferometer fringes of very low intensity,�?? Appl. Opt. 10, 193-200 (1971). [CrossRef] [PubMed]
- H. F. Döbele and J. H. Massig, �??Application of a Fabry-Perot spectrometer to the measurement of spectral line shifts much smaller than line width,�?? Appl. Opt. 15, 69-72 (1976). [CrossRef] [PubMed]
- D. E. Wohlert, K. Y. Cheng, and S. T. Chou, �??Temperature invariant lasing and gain spectra in self-assembled GaInAs quantum wire Fabry--Perot lasers,�?? Appl. Phys. Lett. 78, 1047-1049 (2001) [CrossRef]
- P. D. Atherton, N. K. Reay, J. Ring, and T. R. Hicks, �??Tunable Fabry-Perot filters,�?? Opt. Engr. 20, 806-814 (1981).
- Yu. V. Troitski, �??Dispersion-free, multiple-beam interferometer,�?? Appl. Opt. 34, 4717-4722 (1995). [CrossRef] [PubMed]
- Yu. V. Troitskii, �??Interferometer for measuring ultramall displacements with a nonmonochromatic light source,�?? Sov. J. Quan. Elec. 22, 1051-1054 (1992). [CrossRef]
- Y. C. Lin and W. Q. Lu, Principles of Optical thin films, (National Defence Industry Industry Press of China, 1990), Chap. 2.
- M. Xiang, Y. M. Cai, Y. M. Wu, J. Y. Yang, and Y. L. Wang, �??A Novel Method of fabricating Fabry-Perot Cavity Employing MEMS Wet-Etching Process,�?? Asia-Pacific Optical and Wireless Communications Conference, Jim Hsieh, and Leping Wei, eds., Proc. SPIE 5279-58 (2003).
- M. Born and E. Wolf, Principles of Optics, (Cambridge, 1999), Chap. 7.
- S. R. Mallinson and J. H. Jerman, �??Miniature micromachined Fabry-Perot interferometer in silicon,�?? Electr. Lett. 23, 1041-1043 (1987). [CrossRef]
- A. T. T. D. Tran, Y. H. Lo, Z.H. Zhu, D. Haronian, and E. Mozdy, �??Surface micromachined Fabry-Perot tunable filter,�?? IEEE Photo. Tech. Lett. 8, 393-395 (1996). [CrossRef]
- C. K. Madsen, J. A. Walker, J. E. Ford, K. W. Goossen, T. N. Nielsen, and G. Lenz, �??A Tunable Dispersion Compensating MEMS All-Pass Filter,�?? IEEE Photo. Tech. Lett. 12, 651-653 (2000). [CrossRef]
- K. K. Lee, D. R. Lim, and L. C. Kimerling, �??Fabrication of ultralow-loss Si/SiO2 waveguides by roughness reduction,�?? Opt. Lett. 26, 1888-1890 (2001). [CrossRef]
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