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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 24 — Dec. 1, 2003
  • pp: 3271–3276

Two-point-separation in super-resolution fluorescence microscope based on up-conversion fluorescence depletion technique

Takeshi Watanabe, Yoshinori Iketaki, Takashige Omatsu, Kimihisa Yamamoto, Makoto Sakai, and Masaaki Fujii  »View Author Affiliations


Optics Express, Vol. 11, Issue 24, pp. 3271-3276 (2003)
http://dx.doi.org/10.1364/OE.11.003271


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Abstract

Pronounced separation (750 nm) between two individual fluorescence spots in a novel super-resolution microscopy based on a two-color up-conversion fluorescence depletion technique has been investigated. This microscopy has the potential to achieve a spatial resolution (<300nm) of 1/2 the diffraction limit.

© 2003 Optical Society of America

OCIS Codes
(100.6640) Image processing : Superresolution
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.5810) Microscopy : Scanning microscopy

ToC Category:
Research Papers

History
Original Manuscript: August 26, 2003
Revised Manuscript: November 15, 2003
Published: December 1, 2003

Citation
Takeshi Watanabe, Yoshinori Iketaki, Takashige Omatsu, Kimihisa Yamamoto, Makoto Sakai, and Masaaki Fujii, "Two-point-separation in super-resolution fluorescence microscope based on up-conversion fluorescence depletion technique," Opt. Express 11, 3271-3276 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-24-3271


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