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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 26 — Dec. 29, 2003
  • pp: 3518–3527

Beyond error bars: Understanding uncertainty in ultrashort-pulse frequency-resolved-optical-gating measurements in the presence of ambiguity

Ziyang Wang, Erik Zeek, Rick Trebino, and Paul Kvam  »View Author Affiliations


Optics Express, Vol. 11, Issue 26, pp. 3518-3527 (2003)
http://dx.doi.org/10.1364/OE.11.003518


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Abstract

Previously we showed that the “bootstrap method,” a well-known statistical technique, can be used to automatically compute error bars in ultrashort pulse measurements using frequency-resolved optical gating (FROG) without the need for additional measurements or traditional error analysis. Here we extend the bootstrap method to pulse measurement in the presence of ambiguities, where traditional error bars would give misleading information. As a result, we provide a new approach to displaying this uncertainty, which nicely reveals the richness of information available (or perhaps unavailable) in a FROG trace (or other measurement) in the presence of ambiguities.

© 2003 Optical Society of America

OCIS Codes
(320.5550) Ultrafast optics : Pulses
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology

ToC Category:
Research Papers

History
Original Manuscript: October 1, 2003
Revised Manuscript: December 2, 2003
Published: December 29, 2003

Citation
Ziyang Wang, Erik Zeek, Rick Trebino, and Paul Kvam, "Beyond error bars: Understanding uncertainty in ultrashort-pulse frequency-resolved-optical-gating measurements in the presence of ambiguity," Opt. Express 11, 3518-3527 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-26-3518


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References

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