OSA's Digital Library

Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 7 — Apr. 7, 2003
  • pp: 775–781

Ultra-high resolution index of refraction profiles of femtosecond laser modified silica structures

R. S. Taylor, C. Hnatovsky, E. Simova, D. M. Rayner, M. Mehandale, V. R. Bhardwaj, and P. B. Corkum  »View Author Affiliations

Optics Express, Vol. 11, Issue 7, pp. 775-781 (2003)

View Full Text Article

Enhanced HTML    Acrobat PDF (214 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



The combination of selective chemical etching and atomic force microscopy has been used for the first time to make ultra-high spatial resolution (20 nm) index of refraction profiles of femtosecond laser modified structures in silica glass.

© 2003 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(140.3440) Lasers and laser optics : Laser-induced breakdown
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

ToC Category:
Research Papers

Original Manuscript: March 5, 2003
Revised Manuscript: March 21, 2003
Published: April 7, 2003

Rod Taylor, C. Hnatovsky, E. Simova, D. Rayner, M. Mehandale, V. Bhardwaj, and P. Corkum, "Ultra-high resolution index of refraction profiles of femtosecond laser modified silica structures," Opt. Express 11, 775-781 (2003)

Sort:  Journal  |  Reset  


  1. Q. Zhong and D. Inniss, �??Characterization of the lightguiding structure of optical fiber by atomic force microscopy,�?? J. Lightwave Technol. 12, 1517-1523 (1994). [CrossRef]
  2. K. Raine, J. Baines and D. Putland, �??Refractive index profiling �?? state of the art,�?? J. Lightwave Technol. 7, 1162-1169 (1989). [CrossRef]
  3. N. Gisin and B. Perny, �??Optical fiber characterization by simultaneous measurement of the transmitted and refracted near field,�?? J. Lightwave Technol. 11, 1875-1883 (1993). [CrossRef]
  4. R. Taylor and C. Hnatovsky, �??High resolution index of refraction profiling of optical waveguides,�?? Proc. SPIE 4833, 811-819 (2003). [CrossRef]
  5. J. Kang and C. Musgrave, �??The mechanism of HF/H2O chemical etching of SiO2,�?? J. Chem. Phys. 116, 275-280 (2002). [CrossRef]
  6. S. Huntington, P. Mulvaney, A. Roberts, K. Nugent and M. Bazylenko, �??Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy,�?? J. Appl. Phys. 82, 510-512 (1997). [CrossRef]
  7. K. Chen, P. Herman, R. Taylor and C. Hnatovsky, �??Photosensitivity and application with 157 nm F2 laser radiation in planar lightwave circuits,�?? J. Lightwave Technol. 21, 140-148 (2003). [CrossRef]
  8. A. Streltsov and N. Borrelli, �??Study of femtosecond-laser-written waveguides in glasses,�?? J. Opt. Soc. Am. B 19, 2496-2504 (2002). [CrossRef]
  9. H.Wang, �??Multiple refractive index profiling of optical fibers using the reflection and refracted near-fields methods,�?? Optik 102, 36-40 (1996).
  10. M. Ikeda, M. Tateda and H.Yoshikiyo, �??Refractive index profile of a graded index fiber: measurement by a reflection method,�?? Appl. Opt. 14, 814-815 (1975). [CrossRef] [PubMed]
  11. R. Taylor, C. Hnatovsky, E. Simova, D. Rayner, R. Bhardwaj and P. Corkum, �??Femtosecond laser fabrication of nanostructures in silica glass,�?? accepted to Opt. Lett., 2003. [CrossRef] [PubMed]
  12. L. Sudrie, M.Franco, B. Prade and A. Mysyrowicz, �??Study of damage in fused silica induced by ultra-short IR laser pulses,�?? Opt. Commun. 191, 333-339 (2001). [CrossRef]
  13. C. Schaffer, J. Aus der Au, E. Mazur and J. Squier, �??Micromachining and material change characterization using femtosecond laser oscillators,�?? Proc. SPIE, 4633, 112-118 (2002). [CrossRef]
  14. T. Gorelik, M. Will, S.Nolte, A. Tuennermann and U. Glatzel, �??Transmission electron microscopy studies of femtosecond laser induced modifications in quartz,�?? Appl. Phys. A 76, 309-311 (2003). [CrossRef]
  15. O. L. Bourne, D. M Rayner, P. B. Corkum, M. Mehendale, and A. Naumov, �??Methods for creating optical structures in dielectrics using controlled energy deposition,�?? International Application Published Under the Patent Cooperation Treaty (PCT) WO 02/16070 A2, 2002.
  16. R. Taylor and K. Leopold, �??Probe microscopy for photonic applications,�?? Microscopy and Analysis, May, 15-17 (1999).
  17. J. Chan, T. Huser, S. Risbud and D. Krol, �??Structural changes in fused silica after exposure to focused femtosecond laser pulses,�?? Opt. Lett. 26, 1726-1728 (2001). [CrossRef]
  18. R. Devine, R. Dupree, I. Farnan and J. Capponi, �??Pressure-induced bond-angle variation in amorphous SiO2,�?? Phys. Rev. B 35, 2560-2562 (1987). [CrossRef]
  19. A.Gusarov and D. Boyle, �??Contribution of photoinduced densification to refractive-index modulation in Bragg gratings written in Ge-doped silica fibers,�?? Opt. Lett. 25, 872-874 (2000). [CrossRef]
  20. A. Marcinkevicius, S. Juodkazis, M. Watanabe, M. Miwa, S. Matsuo and H. Misawa, �??Femtosecond laserassisted three-dimensional microfabrication in silica,�?? Opt. Lett. 26, 277-279 (2001). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1. Fig. 2. Fig. 3.
Fig. 4.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited