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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 12 — Jun. 14, 2004
  • pp: 2662–2669

Characterization of a bit-wise volumetric storage medium for a space environment

Y. Zhang, J. Butz, J. Curtis, N. Beaudry, W. L. Bletscher, K. J. Erwin, D. Knight, T. D. Milster, and E. Walker  »View Author Affiliations


Optics Express, Vol. 12, Issue 12, pp. 2662-2669 (2004)
http://dx.doi.org/10.1364/OPEX.12.002662


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Abstract

We report playback performance results of volumetric optical data storage disks that are made from a class of light-absorbing (photo-chromic) compounds. The disks are exposed to a simulated space environment with respect to temperature and radiation. To test for temperature sensitivity, a vacuum oven bakes the disks for certain amount of time at a designated temperature. Radiation exposure includes heavy ions and high energy protons. Disks fail in high temperature and large proton-dose conditions. Heavy ions do not cause significant disk failure. The prevention of disk failure due to harsh space environments is also discussed.

© 2004 Optical Society of America

OCIS Codes
(160.4670) Materials : Optical materials
(210.0210) Optical data storage : Optical data storage
(210.2860) Optical data storage : Holographic and volume memories

ToC Category:
Research Papers

History
Original Manuscript: May 10, 2004
Revised Manuscript: May 24, 2004
Published: June 14, 2004

Citation
Y. Zhang, J. Butz, J. Curtis, N. Beaudry, W. Bletscher, K. Erwin, D. Knight, T. Milster, and E. Walker, "Characterization of a bit-wise volumetric storage medium for a space environment," Opt. Express 12, 2662-2669 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-12-2662


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