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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 12 — Jun. 14, 2004
  • pp: 2739–2745

Interferometric second harmonic generation microscopy

Siavash Yazdanfar, Lily H. Laiho, and Peter T. C. So  »View Author Affiliations


Optics Express, Vol. 12, Issue 12, pp. 2739-2745 (2004)
http://dx.doi.org/10.1364/OPEX.12.002739


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Abstract

We describe a novel second harmonic generation (SHG) microscope that employs heterodyne detection by interfering the epidirected SHG from a sample with SHG from a reference crystal. In addition, the microscope provides complementary reflectance information based on optical coherence microscopy (OCM). The instrument features dual balanced detection to minimize the effect of source fluctuations, and polarization-sensitive detection to measure the nonlinear susceptibility of the sample. Interferometric detection can potentially improve the sensitivity and thus extend the imaging depth as compared with direct detection of SHG.

© 2004 Optical Society of America

OCIS Codes
(170.0110) Medical optics and biotechnology : Imaging systems
(170.4500) Medical optics and biotechnology : Optical coherence tomography
(180.6900) Microscopy : Three-dimensional microscopy
(190.4160) Nonlinear optics : Multiharmonic generation

ToC Category:
Research Papers

History
Original Manuscript: April 29, 2004
Revised Manuscript: June 2, 2004
Published: June 14, 2004

Citation
Siavash Yazdanfar, Lily Laiho, and Peter So, "Interferometric second harmonic generation microscopy," Opt. Express 12, 2739-2745 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-12-2739


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