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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 13 — Jun. 28, 2004
  • pp: 2870–2879

Evolution of electromagnetic interference through nano-metallic double-slit

Kyu-Min Chae, Hyun-Ho Lee, Sang-Youp Yim, and Seung-Han Park  »View Author Affiliations

Optics Express, Vol. 12, Issue 13, pp. 2870-2879 (2004)

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We investigated the characteristics of the near- and far-field regions of the interference for nano-metallic double-slits using a two-dimensional finite-difference time-domain (FDTD) method. We have found that the patterns in the near-field region have a phase difference of π with respect to those in the far-field region. A boundary, which separates the interference patterns of the two regions exists as a half circle and grows as the distance between the two slits increase. It is also found that evanescent waves can be enhanced and confined by coating the double-slit with a dielectric cladding.

© 2004 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(180.3170) Microscopy : Interference microscopy
(180.5810) Microscopy : Scanning microscopy
(260.3160) Physical optics : Interference
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Research Papers

Original Manuscript: April 20, 2004
Revised Manuscript: June 11, 2004
Published: June 28, 2004

Kyu-Min Chae, Hyun-Ho Lee, Sang-Youp Yim, and Seung-Han Park, "Evolution of electromagnetic interference through nano-metallic double-slit," Opt. Express 12, 2870-2879 (2004)

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