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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 13 — Jun. 28, 2004
  • pp: 2960–2965

X-ray phase imaging: Demonstration of extended conditions for homogeneous objects

L. Turner, B. Dhal, J. Hayes, A. Mancuso, K. Nugent, D. Paterson, R. Scholten, C. Tran, and A. Peele  »View Author Affiliations


Optics Express, Vol. 12, Issue 13, pp. 2960-2965 (2004)
http://dx.doi.org/10.1364/OPEX.12.002960


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Abstract

We discuss contrast formation in a propagating x-ray beam. We consider the validity conditions for linear relations based on the transport-of-intensity equation (TIE) and on contrast transfer functions (CTFs). From a single diffracted image, we recover the thickness of a homogeneous object which has substantial absorption and a phase-shift of --0.37 radian.

© 2004 Optical Society of America

OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7460) X-ray optics : X-ray microscopy
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
Research Papers

History
Original Manuscript: May 20, 2004
Revised Manuscript: June 19, 2004
Published: June 28, 2004

Citation
L. Turner, B. Dhal, J. Hayes, A. Mancuso, K. Nugent, D. Paterson, R. Scholten, C. Tran, and A. Peele, "X-ray phase imaging: Demonstration of extended conditions for homogeneous objects," Opt. Express 12, 2960-2965 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-13-2960


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