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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 15 — Jul. 26, 2004
  • pp: 3367–3376

Iterative processing of second-order optical nonlinearity depth profiles

A. Ozcan, M. J. F. Digonnet, and G. S. Kino  »View Author Affiliations

Optics Express, Vol. 12, Issue 15, pp. 3367-3376 (2004)

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We show through numerical simulations and experimental data that a fast and simple iterative loop known as the Fienup algorithm can be used to process the measured Maker-fringe curve of a nonlinear sample to retrieve the sample’s nonlinearity profile. This algorithm is extremely accurate for any profile that exhibits one or two dominant peaks, which covers a wide range of practical profiles, including any nonlinear film of crystalline or organic material (rectangular profiles) and poled silica, for which an excellent experimental demonstration is provided. This algorithm can also be applied to improve the accuracy of the nonlinearity profile obtained by an inverse Fourier transform technique.

© 2004 Optical Society of America

OCIS Codes
(190.4400) Nonlinear optics : Nonlinear optics, materials
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Research Papers

Original Manuscript: June 2, 2004
Revised Manuscript: July 9, 2004
Published: July 26, 2004

A. Ozcan, M. Digonnet, and G. Kino, "Iterative processing of second-order optical nonlinearity depth profiles," Opt. Express 12, 3367-3376 (2004)

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  2. A. Ozcan, M. J. F. Digonnet, and G. S. Kino, "Inverse Fourier transform technique to determine secondorder optical nonlinearity spatial profiles," Appl. Phys. Lett. 82, 1362-1364 (2003). [CrossRef]
  3. A. Ozcan, M. J. F. Digonnet, and G. S. Kino, "Improved technique to determine second-order optical nonlinearity profiles using two different samples," Appl. Phys. Lett. 84, 681-683 (2004). [CrossRef]
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  12. A. Ozcan, M. J. F. Digonnet, and G. S. Kino, Edward L. Ginzton Laboratory, Stanford University, Stanford, CA 94305, are preparing a manuscript to be called "Detailed analysis of inverse Fourier transform techniques to uniquely infer second-order nonlinearity profile of thin films."
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