OSA's Digital Library

Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 15 — Jul. 26, 2004
  • pp: 3443–3451

Reducing symmetric polarization aberrations in a lens by annealing

J. Wolfe and R. A. Chipman  »View Author Affiliations


Optics Express, Vol. 12, Issue 15, pp. 3443-3451 (2004)
http://dx.doi.org/10.1364/OPEX.12.003443


View Full Text Article

Enhanced HTML    Acrobat PDF (314 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Radially symmetric retardance was found in antireflection coated, molded aspheric glass lenses by measurement with a Mueller matrix imaging polarimeter. The source of the unexpected polarization aberration is traced to a remarkably symmetric radial stress birefringence in the glass believed to arise during fire-polishing of the surfaces. While annealing the lenses relieves much of the stress birefringence, reducing the retardance of the lenses by a factor of five, the lenses remained unusable.

© 2004 Optical Society of America

OCIS Codes
(080.2710) Geometric optics : Inhomogeneous optical media
(080.3630) Geometric optics : Lenses
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(220.5450) Optical design and fabrication : Polishing
(260.5430) Physical optics : Polarization

ToC Category:
Research Papers

History
Original Manuscript: June 9, 2004
Revised Manuscript: July 14, 2004
Published: July 26, 2004

Citation
J. Wolfe and R. Chipman, "Reducing symmetric polarization aberrations in a lens by annealing," Opt. Express 12, 3443-3451 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-15-3443


Sort:  Journal  |  Reset  

References

  1. <a href="http://www.lightpath.com/Aspheric.htm">http://www.lightpath.com/Aspheric.htm</a>
  2. P. S. Theocaris and E. E. Gdoutos, Matrix Theory of Photoelasticity, Chap. 2, (Springer-Verlag, Berlin, 1979)
  3. J. Wolfe and R.A. Chipman, �??High-speed imaging polarimeter,�?? in Polarization Measurement and Analysis J. Shaw and J. S. Tyo, eds. Proc SPIE 5158, 24-32 (2003)
  4. J. Pezzaniti and R.A. Chipman, �??Mueller matrix imaging polarimetry,�?? Opt. Eng. 34, no. 6, 1558-1568 , (1995) [CrossRef]
  5. R.A. Chipman, Handbook of Optics, Chap. 22, M. Bass, ed., (McGraw Hill, New York, 2nd Edition, 1995)
  6. D. Goldstein, Polarized Light, 2d Ed., Chap. 28, (Marcel Dekker, Inc., New York, 2003) [CrossRef]
  7. R.M.A Azzam and M.M.K. Howlader, �??Fourth- and sixth-order polarization aberrations of antireflection-coated optical surfaces,�?? Opt. Let. 26 no. 20, 1607-1608 (2001) [CrossRef]
  8. Otani Y., T. Shimada, T.Yoshizawa, and N.Umeda, �??Opt. Eng. 33, no.5, 1604-1609, (1994)Two-dimensional birefringence measurement using the phase shifting technique,�?? [CrossRef]
  9. J.J. Gil and E. Bernabeu, �??A depolarization criterion in Mueller matrices,�?? Opt. Acta 32, 259-261 (1985) [CrossRef]
  10. J.J. Gil and E. Bernabeu, �??Depolarization and polarization indices of an optical system,�?? Opt. Acta 33, 185-189 (1986) [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited