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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 15 — Jul. 26, 2004
  • pp: 3443–3451

Reducing symmetric polarization aberrations in a lens by annealing

J. Wolfe and R. A. Chipman  »View Author Affiliations

Optics Express, Vol. 12, Issue 15, pp. 3443-3451 (2004)

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Radially symmetric retardance was found in antireflection coated, molded aspheric glass lenses by measurement with a Mueller matrix imaging polarimeter. The source of the unexpected polarization aberration is traced to a remarkably symmetric radial stress birefringence in the glass believed to arise during fire-polishing of the surfaces. While annealing the lenses relieves much of the stress birefringence, reducing the retardance of the lenses by a factor of five, the lenses remained unusable.

© 2004 Optical Society of America

OCIS Codes
(080.2710) Geometric optics : Inhomogeneous optical media
(080.3630) Geometric optics : Lenses
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(220.5450) Optical design and fabrication : Polishing
(260.5430) Physical optics : Polarization

ToC Category:
Research Papers

Original Manuscript: June 9, 2004
Revised Manuscript: July 14, 2004
Published: July 26, 2004

J. Wolfe and R. Chipman, "Reducing symmetric polarization aberrations in a lens by annealing," Opt. Express 12, 3443-3451 (2004)

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  1. <a href="http://www.lightpath.com/Aspheric.htm">http://www.lightpath.com/Aspheric.htm</a>
  2. P. S. Theocaris and E. E. Gdoutos, Matrix Theory of Photoelasticity, Chap. 2, (Springer-Verlag, Berlin, 1979)
  3. J. Wolfe and R.A. Chipman, �??High-speed imaging polarimeter,�?? in Polarization Measurement and Analysis J. Shaw and J. S. Tyo, eds. Proc SPIE 5158, 24-32 (2003)
  4. J. Pezzaniti and R.A. Chipman, �??Mueller matrix imaging polarimetry,�?? Opt. Eng. 34, no. 6, 1558-1568 , (1995) [CrossRef]
  5. R.A. Chipman, Handbook of Optics, Chap. 22, M. Bass, ed., (McGraw Hill, New York, 2nd Edition, 1995)
  6. D. Goldstein, Polarized Light, 2d Ed., Chap. 28, (Marcel Dekker, Inc., New York, 2003) [CrossRef]
  7. R.M.A Azzam and M.M.K. Howlader, �??Fourth- and sixth-order polarization aberrations of antireflection-coated optical surfaces,�?? Opt. Let. 26 no. 20, 1607-1608 (2001) [CrossRef]
  8. Otani Y., T. Shimada, T.Yoshizawa, and N.Umeda, �??Opt. Eng. 33, no.5, 1604-1609, (1994)Two-dimensional birefringence measurement using the phase shifting technique,�?? [CrossRef]
  9. J.J. Gil and E. Bernabeu, �??A depolarization criterion in Mueller matrices,�?? Opt. Acta 32, 259-261 (1985) [CrossRef]
  10. J.J. Gil and E. Bernabeu, �??Depolarization and polarization indices of an optical system,�?? Opt. Acta 33, 185-189 (1986) [CrossRef]

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