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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 16 — Aug. 9, 2004
  • pp: 3820–3826

White-light continuum Z-scan technique for nonlinear materials characterization

Mihaela Balu, Joel Hales, David Hagan, and Eric Van Stryland  »View Author Affiliations


Optics Express, Vol. 12, Issue 16, pp. 3820-3826 (2004)
http://dx.doi.org/10.1364/OPEX.12.003820


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Abstract

We present a technique for rapid characterization of degenerate nonlinear absorption and refraction spectra using a femtosecond white-light continuum (WLC) pulse to perform Z-scans. The spectral components of the WLC source are temporally and spatially dispersed to minimize nondegenerate two-photon absorption (2PA) processes. We demonstrate the validity of the method by measuring the 2PA spectrum of a well-characterized semiconductor, ZnSe.

© 2004 Optical Society of America

OCIS Codes
(190.4400) Nonlinear optics : Nonlinear optics, materials
(300.6420) Spectroscopy : Spectroscopy, nonlinear

ToC Category:
Research Papers

History
Original Manuscript: June 23, 2004
Revised Manuscript: July 26, 2004
Published: August 9, 2004

Citation
Mihaela Balu, Joel Hales, David Hagan, and Eric Van Stryland, "White-light continuum Z-scan technique for nonlinear materials characterization," Opt. Express 12, 3820-3826 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-16-3820


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