White-light continuum Z-scan technique for nonlinear materials characterization
Optics Express, Vol. 12, Issue 16, pp. 3820-3826 (2004)
http://dx.doi.org/10.1364/OPEX.12.003820
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Abstract
We present a technique for rapid characterization of degenerate nonlinear absorption and refraction spectra using a femtosecond white-light continuum (WLC) pulse to perform Z-scans. The spectral components of the WLC source are temporally and spatially dispersed to minimize nondegenerate two-photon absorption (2PA) processes. We demonstrate the validity of the method by measuring the 2PA spectrum of a well-characterized semiconductor, ZnSe.
© 2004 Optical Society of America
OCIS Codes
(190.4400) Nonlinear optics : Nonlinear optics, materials
(300.6420) Spectroscopy : Spectroscopy, nonlinear
ToC Category:
Research Papers
History
Original Manuscript: June 23, 2004
Revised Manuscript: July 26, 2004
Published: August 9, 2004
Citation
Mihaela Balu, Joel Hales, David Hagan, and Eric Van Stryland, "White-light continuum Z-scan technique for nonlinear materials characterization," Opt. Express 12, 3820-3826 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-16-3820
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