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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 18 — Sep. 6, 2004
  • pp: 4255–4260

Solid-state carrier-envelope-phase noise measurements with intrinsically balanced detection

Peter A. Roos, Xiaoqin Li, Jessica A. Pipis, and Steven T. Cundiff  »View Author Affiliations


Optics Express, Vol. 12, Issue 18, pp. 4255-4260 (2004)
http://dx.doi.org/10.1364/OPEX.12.004255


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Abstract

We use interference between single- and two-photon photocurrent generation pathways in a semiconductor to measure the out-of-loop carrier-envelope-phase noise of a stabilized Ti:sapphire modelocked laser. This solid-state measurement technique exhibits no significant amplitude/phase coupling, adds no measurable phase noise compared to the standard self-referencing technique, and requires few optical components. The method features a built-in balanced detection mechanism that is particularly appealing for dc carrier-envelope-phase measurements.

© 2004 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(190.5970) Nonlinear optics : Semiconductor nonlinear optics including MQW
(270.1670) Quantum optics : Coherent optical effects
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Research Papers

History
Original Manuscript: August 20, 2004
Revised Manuscript: August 24, 2004
Published: September 6, 2004

Citation
Peter Roos, Xiaoqin Li, Jessica Pipis, and Steven Cundiff, "Solid-state carrier-envelope-phase noise measurements with intrinsically balanced detection," Opt. Express 12, 4255-4260 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-18-4255


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