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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 19 — Sep. 20, 2004
  • pp: 4635–4649

Time-resolved Mueller matrix imaging polarimetry

Ihor Berezhnyy and Aristide Dogariu  »View Author Affiliations

Optics Express, Vol. 12, Issue 19, pp. 4635-4649 (2004)

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We present a new method of time-resolved Mueller matrix imaging polarimetry for spatial and temporal characterization of the polarization effects in backscattering from turbid media. The technique allows measuring the time evolution of spatially varying polarization patterns of diffusely backscattered light with picosecond resolution. A series of time-resolved polarization patterns are obtained at various time delays, are analyzed in sequence, and used to separate the polarimetric contributions of different scattering paths. Specific features of the 2D Mueller matrix components corresponding to light backscattered from colloidal suspensions were determined and characterized. The temporally-and spatially-resolved measurements permit detailed analysis of the changes in the magnitude, sign, and the general symmetry properties of Mueller matrix components.

© 2004 Optical Society of America

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(110.7050) Imaging systems : Turbid media
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(290.5820) Scattering : Scattering measurements
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Research Papers

Original Manuscript: July 15, 2004
Revised Manuscript: September 14, 2004
Published: September 20, 2004

Ihor Berezhnyy and Aristide Dogariu, "Time-resolved Mueller matrix imaging polarimetry," Opt. Express 12, 4635-4649 (2004)

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