© 2004 Optical Society of America

1. K. Creath, �??Temporal phase measuring methods,�?? in Interferogram Analysis: Digital Fringe Pattern Measurement Techniques, D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, UK, 1993).
2. Y. Ishii, J. Chen, and K. Murata, �??Digital phase-measuring interferometry with a tunable laser diode,�?? Opt. Lett. 12, 233-235 (1988). [CrossRef]
3. Hariharan P., Roeb. B and T. Eiju, �??Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,�?? Appl. Opt. 26, 2504-2506 (1987). [CrossRef] [PubMed]
4. P. de Groot and L. Deck, �??Three-dimensional imaging by sub-Nyquist sampling of white-light interferomgrams,�?? Opt. Lett. 18, 1462-1464 (1993). [CrossRef] [PubMed]
5. J. Schwider and L. Zhou, �??Dispersive interferometric profilometer,�?? Opt. Lett. 19, 995-997 (1994). [CrossRef] [PubMed]
6. M. Kinoshita, M. Takeda, H. Yago, Y. Watanabe, and T. Kurokawa, �??Optical frequency-domain microprofilometry with a frequency-tunable liquid-crystal Fabry-Perot etalon device,�?? Appl. Opt. 38, 7063-7068 (1999). [CrossRef]
7. I. Yamaguchi, �??Surface tomography by wavelength scanning interferometry,�?? Opt. Eng. 39, 40-46 (2000). [CrossRef]
8. D. S. Mehta, S. Saito, H. Hinosugi, M. Takeda, and T. Kurokawa, �??Spectral interference Mirau microscope with an acousto-optic tunable filter for three-dimensional surface profilometry,�?? Appl. Opt. 42, 1296-1305 (2003). [CrossRef] [PubMed]
9. D. Kim, S. Kim, H. Kong and Y. Lee, �??Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter,�?? Opt. Lett. 27, 1893-1895 (2002). [CrossRef]
10. S. W. Kim, G.H. Kim, �??Thickness profile measurement of transparent thin-film layers by white-light scanning interferometry,�?? Appl. Opt. 38, 5968-5973 (1999). [CrossRef]
11. . M. Takeda, Hideki Ina and Seiji Kobayashi, �??Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,�?? J. Opt. Soc. Am. 72, 156 -160 (1982). [CrossRef]
12. T. Kreis, �??Digital holographic interference-phase measurement using the Fourier-transform method,�?? J. Opt. Soc. Am. A 3, 847-855 (1986). [CrossRef]
13. G. Pedrini, I. Alexeenko, W. Osten, and H. J. Tiziani, �??Temporal phase unwrapping of digital hologram sequences,�?? Appl. Opt. 42, 5846-5854 (2003). [CrossRef] [PubMed]
14. The Levenberg-Marquardt algorithm is available as lsqnonlin function by a commercial S/W MATLAB.

Appl. Opt.

• Hariharan P., Roeb. B and T. Eiju, �??Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,�?? Appl. Opt. 26, 2504-2506 (1987). [CrossRef] [PubMed]
• M. Kinoshita, M. Takeda, H. Yago, Y. Watanabe, and T. Kurokawa, �??Optical frequency-domain microprofilometry with a frequency-tunable liquid-crystal Fabry-Perot etalon device,�?? Appl. Opt. 38, 7063-7068 (1999). [CrossRef]
• D. S. Mehta, S. Saito, H. Hinosugi, M. Takeda, and T. Kurokawa, �??Spectral interference Mirau microscope with an acousto-optic tunable filter for three-dimensional surface profilometry,�?? Appl. Opt. 42, 1296-1305 (2003). [CrossRef] [PubMed]
• S. W. Kim, G.H. Kim, �??Thickness profile measurement of transparent thin-film layers by white-light scanning interferometry,�?? Appl. Opt. 38, 5968-5973 (1999). [CrossRef]
• G. Pedrini, I. Alexeenko, W. Osten, and H. J. Tiziani, �??Temporal phase unwrapping of digital hologram sequences,�?? Appl. Opt. 42, 5846-5854 (2003). [CrossRef] [PubMed]

J. Opt. Soc. Am.

• . M. Takeda, Hideki Ina and Seiji Kobayashi, �??Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,�?? J. Opt. Soc. Am. 72, 156 -160 (1982). [CrossRef]

J. Opt. Soc. Am. A

• T. Kreis, �??Digital holographic interference-phase measurement using the Fourier-transform method,�?? J. Opt. Soc. Am. A 3, 847-855 (1986). [CrossRef]

Opt. Eng.

• I. Yamaguchi, �??Surface tomography by wavelength scanning interferometry,�?? Opt. Eng. 39, 40-46 (2000). [CrossRef]

Opt. Lett.

• D. Kim, S. Kim, H. Kong and Y. Lee, �??Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter,�?? Opt. Lett. 27, 1893-1895 (2002). [CrossRef]
• P. de Groot and L. Deck, �??Three-dimensional imaging by sub-Nyquist sampling of white-light interferomgrams,�?? Opt. Lett. 18, 1462-1464 (1993). [CrossRef] [PubMed]
• J. Schwider and L. Zhou, �??Dispersive interferometric profilometer,�?? Opt. Lett. 19, 995-997 (1994). [CrossRef] [PubMed]
• Y. Ishii, J. Chen, and K. Murata, �??Digital phase-measuring interferometry with a tunable laser diode,�?? Opt. Lett. 12, 233-235 (1988). [CrossRef]

Other

• K. Creath, �??Temporal phase measuring methods,�?? in Interferogram Analysis: Digital Fringe Pattern Measurement Techniques, D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, UK, 1993).
• The Levenberg-Marquardt algorithm is available as lsqnonlin function by a commercial S/W MATLAB.

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