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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 21 — Oct. 18, 2004
  • pp: 5274–5284

Optics InfoBase > Optics Express > Volume 12 > Issue 21 > Page 5274

Higher order mode conversion via focused ion beam milled Bragg gratings in Silicon-on-Insulator waveguides

Vahid Ta'eed, D. Moss, B. Eggleton, D. Freeman, S. Madden, M. Samoc, B. Luther-Davies, S. Janz, and D. Xu  »View Author Affiliations


Optics Express, Vol. 12, Issue 21, pp. 5274-5284 (2004)
http://dx.doi.org/10.1364/OPEX.12.005274


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Abstract

We report the first Bragg gratings fabricated by Focused Ion Beam milling in optical waveguides. We observe striking features in the optical transmission spectra of surface relief gratings in silicon-on-insulator waveguides and achieve good agreement with theoretical results obtained using a novel adaptation of the beam propagation method and coupled mode theory. We demonstrate that leaky Higher Order Modes (HOM), often present in large numbers (although normally not observed) even in nominally single mode rib waveguides, can dramatically affect the Bragg grating optical transmission spectra. We investigate the dependence of the grating spectrum on grating dimensions and etch depth, and show that our results have significant implications for designing narrow spectral width gratings in high index waveguides, either for minimizing HOM effects for conventional WDM filters, or potentially for designing devices to capitalize on very efficient HOM conversion.

© 2004 Optical Society of America

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(130.3120) Integrated optics : Integrated optics devices

ToC Category:
Research Papers

History
Original Manuscript: August 31, 2004
Revised Manuscript: October 13, 2004
Published: October 18, 2004

Citation
Vahid Ta'eed, D. Moss, B. Eggleton, D. Freeman, S. Madden, M. Samoc, B. Luther-Davies, S. Janz, and D. Xu, "Higher order mode conversion via focused ion beam milled Bragg gratings in Silicon-on-Insulator waveguides," Opt. Express 12, 5274-5284 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-21-5274


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