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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 22 — Nov. 1, 2004
  • pp: 5296–5306

Correlation Algorithm to recover the phase of a test surface using Phase-Shifting Interferometry

A. Nava-Vega, L. Salas, E. Luna, and A. Cornejo-Rodríguez  »View Author Affiliations

Optics Express, Vol. 12, Issue 22, pp. 5296-5306 (2004)

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A correlation algorithm to recover the phase in phase-shifting interferometry is presented. We make numerical simulations to test the proposed algorithm and apply it to real interferograms with satisfactory results.

© 2004 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Research Papers

Original Manuscript: September 3, 2004
Revised Manuscript: October 13, 2004
Published: November 1, 2004

Adriana Nava-Vega, L. Salas, E. Luna, and A. Cornejo-Rodríguez, "Correlation algorithm to recover the phase of a test surface using phase-shifting interferometry," Opt. Express 12, 5296-5306 (2004)

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