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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 22 — Nov. 1, 2004
  • pp: 5296–5306

Correlation Algorithm to recover the phase of a test surface using Phase-Shifting Interferometry

A. Nava-Vega, L. Salas, E. Luna, and A. Cornejo-Rodríguez  »View Author Affiliations


Optics Express, Vol. 12, Issue 22, pp. 5296-5306 (2004)
http://dx.doi.org/10.1364/OPEX.12.005296


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Abstract

A correlation algorithm to recover the phase in phase-shifting interferometry is presented. We make numerical simulations to test the proposed algorithm and apply it to real interferograms with satisfactory results.

© 2004 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Research Papers

History
Original Manuscript: September 3, 2004
Revised Manuscript: October 13, 2004
Published: November 1, 2004

Citation
Adriana Nava-Vega, L. Salas, E. Luna, and A. Cornejo-Rodríguez, "Correlation algorithm to recover the phase of a test surface using phase-shifting interferometry," Opt. Express 12, 5296-5306 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-22-5296


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References

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