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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 22 — Nov. 1, 2004
  • pp: 5325–5335

Near-field imaging by a micro-particle: a model for conversion of evanescent photons into propagating photons

Djenan Ganic, Xiaosong Gan, and Min Gu  »View Author Affiliations

Optics Express, Vol. 12, Issue 22, pp. 5325-5335 (2004)

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In this letter we present a physical model, both theoretically and experimentally, which describes the mechanism for the conversion of evanescent photons into propagating photons detectable by an imaging system. The conversion mechanism consists of two physical processes, near-field Mie scattering enhanced by morphology dependant resonance and vectorial diffraction. For dielectric probe particles, these two processes lead to the formation of an interference-like pattern in the far-field of a collecting objective. The detailed knowledge of the far-field structure of converted evanescent photons is extremely important for designing novel detection systems. This model should find broad applications in near-field imaging, optical nanometry and near-field metrology.

© 2004 Optical Society of America

OCIS Codes
(110.2990) Imaging systems : Image formation theory
(140.7010) Lasers and laser optics : Laser trapping
(260.1960) Physical optics : Diffraction theory

ToC Category:
Research Papers

Original Manuscript: September 1, 2004
Revised Manuscript: October 12, 2004
Published: November 1, 2004

Djenan Ganic, Xiaosong Gan, and Min Gu, "Near-field imaging by a micro-particle: a model for conversion of evanescent photons into propagating photons," Opt. Express 12, 5325-5335 (2004)

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