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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 22 — Nov. 1, 2004
  • pp: 5533–5538

Trapping force and optical lifting under focused evanescent wave illumination

Djenan Ganic, Xiaosong Gan, and Min Gu  »View Author Affiliations


Optics Express, Vol. 12, Issue 22, pp. 5533-5538 (2004)
http://dx.doi.org/10.1364/OPEX.12.005533


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Abstract

A physical model is presented to understand and calculate trapping force exerted on a dielectric micro-particle under focused evanescent wave illumination. This model is based on our recent vectorial diffraction model by a high numerical aperture objective operating under the total internal condition. As a result, trapping force in a focused evanescent spot generated by both plane wave (TEM00) and doughnut beam (TEM* 01) illumination is calculated, showing an agreement with the measured results. It is also revealed by this model that unlike optical trapping in the far-field region, optical axial trapping force in an evanescent focal spot increases linearly with the size of a trapped particle. This prediction shows that it is possible to overcome the force of gravity to lift a polystyrene particle of up to 800 nm in radius with a laser beam of power 10 µW.

© 2004 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(140.7010) Lasers and laser optics : Laser trapping
(260.1960) Physical optics : Diffraction theory

ToC Category:
Research Papers

History
Original Manuscript: September 16, 2004
Revised Manuscript: October 26, 2004
Published: November 1, 2004

Citation
Djenan Ganic, Xiaosong Gan, and Min Gu, "Trapping force and optical lifting under focused evanescent wave illumination," Opt. Express 12, 5533-5538 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-22-5533


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