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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 23 — Nov. 15, 2004
  • pp: 5729–5734

High stability multiplexed fibre interferometer and its application on absolute displacement measurement and on-line surface metrology

Dejiao Lin, Xiangqian Jiang, Fang Xie, Wei Zhang, Lin Zhang, and Ian Bennion  »View Author Affiliations

Optics Express, Vol. 12, Issue 23, pp. 5729-5734 (2004)

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We propose a self-reference multiplexed fibre interferometer (MFI) by using a tunable laser and fibre Bragg grating (FBG). The optical measurement system multiplexes two Michelson fibre interferometers with shared optical path in the main part of optical system. One fibre optic interferometer is used as a reference interferometer to monitor and control the high accuracy of the measurement system under environmental perturbations. The other is used as a measurement interferometer to obtain information from the target. An active phase tracking homodyne (APTH) technique is applied for signal processing to achieve high resolution. MFI can be utilised for high precision absolute displacement measurement with different combination of wavelengths from the tuneable laser. By means of Wavelength-Division-Multiplexing (WDM) technique, MFI is also capable of realising on-line surface measurement, in which traditional stylus scanning is replaced by spatial light-wave scanning so as to greatly improve the measurement speed and robustness.

© 2004 Optical Society of America

OCIS Codes
(060.2310) Fiber optics and optical communications : Fiber optics
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness

ToC Category:
Research Papers

Original Manuscript: October 7, 2004
Revised Manuscript: November 5, 2004
Published: November 15, 2004

Dejiao Lin, Xiangqian Jiang, Fang Xie, Wei Zhang, Lin Zhang, and Ian Bennion, "High stability multiplexed fiber interferometer and its application on absolute displacement measurement and on-line surface metrology," Opt. Express 12, 5729-5734 (2004)

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