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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 23 — Nov. 15, 2004
  • pp: 5789–5794

Improvement to reflective dielectric film color pictures

Joshua Kvavle, Cara Bell, Justin Henrie, Stephen Schultz, and Aaron Hawkins  »View Author Affiliations


Optics Express, Vol. 12, Issue 23, pp. 5789-5794 (2004)
http://dx.doi.org/10.1364/OPEX.12.005789


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Abstract

This paper presents methods used to improve reflective dielectric film color pictures. These changes include improvements in color purity, increased brightness, and elimination of any light absorption within the film layers. The color picture is fabricated by varying the silicon dioxide film thicknesses across a silicon wafer and coating the entire wafer with a thin layer of silicon nitride. In addition to the demonstration of fabricated color pictures, we also present more detailed calculation of basis colors and provide details of the fabrication process.

© 2004 Optical Society of America

OCIS Codes
(330.1690) Vision, color, and visual optics : Color
(330.1710) Vision, color, and visual optics : Color, measurement

ToC Category:
Research Papers

History
Original Manuscript: September 21, 2004
Revised Manuscript: November 5, 2004
Published: November 15, 2004

Citation
Joshua Kvavle, Cara Bell, Justin Henrie, Stephen Schultz, and Aaron Hawkins, "Improvement to reflective dielectric film color pictures," Opt. Express 12, 5789-5794 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-23-5789


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