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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 24 — Nov. 29, 2004
  • pp: 5987–5995

Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope

Thomas Grosges, Stéphane Petit, Dominique Barchiesi, and Sylvain Hudlet  »View Author Affiliations

Optics Express, Vol. 12, Issue 24, pp. 5987-5995 (2004)

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The electromagnetic field enhancement (FE) at the end of the probe of an Apertureless Scanning Near-field Optical Microscope (ASNOM) is used to write nanometric dots in a phase-change medium. The FE acts as a heat source that allows the transition from amorphous to crystalline phase in a Ge2Sb2Te5 layer. Through the 2D Finite Element Method (FEM) we predict the size of the dot as a function of both the illumination duration and the incoming power density. Numerical results are found to be in good agreement with preliminary experimental data.

© 2004 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(260.2110) Physical optics : Electromagnetic optics

ToC Category:
Research Papers

Original Manuscript: October 14, 2004
Revised Manuscript: November 17, 2004
Published: November 29, 2004

Thomas Grosges, Stéphane Petit, Dominique Barchiesi, and Sylvain Hudlet, "Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope," Opt. Express 12, 5987-5995 (2004)

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