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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 25 — Dec. 13, 2004
  • pp: 6341–6349

Polarization and detection angle dependence of interferometric imaging with scattering near-field scanning optical microscope

Cheng Liu and Seung-Han Park  »View Author Affiliations

Optics Express, Vol. 12, Issue 25, pp. 6341-6349 (2004)

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Polarized images generated by the scattering near-field scanning optical microscopic interferometer were numerically studied by modeling the interferometer as a coupled point-dipole system. It was shown that, for a given specimen, the resolution of the near-field intensity and phase images were strongly dependent on both the polarization-direction of the reference light and the position of the far-field detector, revealing the strong polarization dependence of the near-field images. In the case of evanescent illumination, highly accurate images could be realized only when the detector was placed at a large enough view angle with the specimen and the reference light was polarized in the detecting-plane, which is vertical to the sample plane and contains both the detection point and the probe-tip.

© 2004 Optical Society of America

OCIS Codes
(110.3080) Imaging systems : Infrared imaging
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(180.5810) Microscopy : Scanning microscopy
(230.5440) Optical devices : Polarization-selective devices

ToC Category:
Research Papers

Original Manuscript: August 26, 2004
Revised Manuscript: November 27, 2004
Published: December 13, 2004

Cheng Liu and Seung-Han Park, "Polarization and detection angle dependence of interferometric imaging with scattering near-field scanning optical microscope," Opt. Express 12, 6341-6349 (2004)

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