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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 26 — Dec. 27, 2004
  • pp: 6434–6439

Single-longitudinal-mode semiconductor laser with digital and mode-hop-free fine-tuning mechanisms

Tsung-Sheng Shih, Yu-Ping Lan, Yea-Feng Lin, Ru-Pin Pan, and Ci-Ling Pan  »View Author Affiliations

Optics Express, Vol. 12, Issue 26, pp. 6434-6439 (2004)

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We report a novel external cavity laser diode (λ=1.5 µm). An intra-cavity liquid crystal pixel mirror allows digitally tuning of the laser wavelength to more than 40 wavelength channels of 100 GHz spacing according to the International Telecommunication Union (ITU) grid. Laser wavelength can further be fine-tuned by varying the driving voltages applied to an intra-cavity planar nematic liquid crystal phase plate. With a cell 52.3 µm in thickness, the output frequency can be continuously tuned over 1.89 GHz. The root-mean-square voltage required for driving the phase plate was from 1.00 to 4.56 volts.

© 2004 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(060.4510) Fiber optics and optical communications : Optical communications
(140.2020) Lasers and laser optics : Diode lasers
(140.3410) Lasers and laser optics : Laser resonators
(140.3570) Lasers and laser optics : Lasers, single-mode
(140.3600) Lasers and laser optics : Lasers, tunable
(140.5960) Lasers and laser optics : Semiconductor lasers
(160.3710) Materials : Liquid crystals
(230.3720) Optical devices : Liquid-crystal devices

ToC Category:
Research Papers

Original Manuscript: November 5, 2004
Revised Manuscript: December 4, 2004
Published: December 27, 2004

Tsung-Sheng Shih, Yu-Ping Lan, Yea-Feng Lin, Ru-Pin Pan, and Ci-Ling Pan, "Single-longitudinal-mode semiconductor laser with digital and mode-hop-free fine-tuning mechanisms," Opt. Express 12, 6434-6439 (2004)

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  1. H. Hatateyama, K. Kudo, Y. Yokoyama, K. Naniwae and T. Sasaki, �??Wavelength-selectable microarray light source for wide-band DWDM applications,�?? Select. Topics Quantum. ElectronIEEE J.. 8, 1341-1348 (2002) [CrossRef]
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