Characterization of surface crystallization in Ge-doped graded-index silica glass
Optics Express, Vol. 12, Issue 6, pp. 1055-1060 (2004)
http://dx.doi.org/10.1364/OPEX.12.001055
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Abstract
Surface crystallization was induced in Ge-doped silica glass samples from a graded-index optical fiber preform by re-heating them at 1100°C for several hours. X-ray diffraction and second-harmonic generation (SHG) microscopy have been utilized to investigate the crystalline phases formed. Experimental results indicate that the predominant crystalline phase is α-cristobalite. The cross-sectional distribution of the crystal particles has also been measured with the SHG microscopy and the result is in good agreement with that from traditional bright field light microscopy.
© 2004 Optical Society of America
OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(190.4400) Nonlinear optics : Nonlinear optics, materials
ToC Category:
Research Papers
History
Original Manuscript: February 11, 2004
Revised Manuscript: February 29, 2004
Published: March 22, 2004
Citation
Honglin An, Ying Tang, Pam McNamara, and Simon Fleming, "Characterization of surface crystallization in Ge-doped graded-index silica glass," Opt. Express 12, 1055-1060 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-6-1055
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References
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