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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 12, Iss. 9 — May. 3, 2004
  • pp: 1892–1901

Minimally invasive optical beam profiler

Nabeel A. Riza and Doug Jorgesen  »View Author Affiliations


Optics Express, Vol. 12, Issue 9, pp. 1892-1901 (2004)
http://dx.doi.org/10.1364/OPEX.12.001892


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Abstract

Proposed and demonstrated is a minimally invasive optical beam profiler using a non-pixelated liquid crystal spatial light modulator. The profiler features high detection sensitivity in the visible band, high 50 lines/mm spatial resolution, beam observation zone 100 % fill factor and magnification flexibility, and video rate operations. Applications for this beam profiler includes plug and test beam measurements with minimal interruptions and feedback effects introduced into the optical beam system under test.

© 2004 Optical Society of America

OCIS Codes
(060.4510) Fiber optics and optical communications : Optical communications
(120.5800) Instrumentation, measurement, and metrology : Scanners
(160.3710) Materials : Liquid crystals
(230.5440) Optical devices : Polarization-selective devices

ToC Category:
Research Papers

History
Original Manuscript: March 8, 2004
Revised Manuscript: April 16, 2004
Published: May 3, 2004

Citation
Nabeel Riza and Doug Jorgesen, "Minimally Invasive Optical Beam Profiler," Opt. Express 12, 1892-1901 (2004)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-12-9-1892


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References

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