OSA's Digital Library

Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 1 — Jan. 10, 2005
  • pp: 106–114

Projection pattern intensity control technique for 3-D optical measurement

Cunwei Lu and Genki Cho  »View Author Affiliations


Optics Express, Vol. 13, Issue 1, pp. 106-114 (2005)
http://dx.doi.org/10.1364/OPEX.13.000106


View Full Text Article

Enhanced HTML    Acrobat PDF (1178 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A new projection pattern control technique is presented in an attempt to solve the problem whereby an image having an ideal intensity distribution cannot be photographed when measurement conditions, such as object color or object surface reflection, change. The proposed technique can adjust the intensity distribution of a projection pattern automatically, according to changes in the measurement conditions. An image with an ideal intensity distribution can then be obtained in a short time, approximately three projections on average. Thus, the speed, robustness, and practicality of 3-D image measurement can be improved.

© 2005 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Research Papers

History
Original Manuscript: October 27, 2004
Revised Manuscript: December 15, 2004
Manuscript Accepted: December 22, 2004
Published: January 10, 2005

Citation
Cunwei Lu and Genki Cho, "Projection pattern intensity control technique for 3-D optical measurement," Opt. Express 13, 106-114 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-1-106


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. J.  Batlle, E.  Mouaddib, J.  Salvi, “Recent progress in coded structured light as a technique to solve the correspondence problem: a survey,” Pattern Recogn. 31, 963–982 (1998). [CrossRef]
  2. E.  Horn, N.  Kiryati, “Toward optimal structured light patterns,” Image Vision Comput. 17, 87–97 (1999). [CrossRef]
  3. Y. C.  Hsieh, “Decoding structured light patterns for three dimensional imaging systems,” Pattern Recogn. 34, 343–349 (2001). [CrossRef]
  4. B.  Carrihill, R.  Hummel, “Experiments with the intensity ratio depth sensor,” Computer Vision, Graphics and Image Processing 32, 337–358(1985). [CrossRef]
  5. M.  Ito, A.  Ishii, “A Three-Level Checkerboard Pattern (TCP) Projection Method for Curved Surface Measurement,” Pattern Recogn. 28, 27–40 (1995). [CrossRef]
  6. K.  Kalms, P.  Jueptner, W.  Osten, “Automatic adaptation of projected fringe patterns using a programmable LCD-projector,” in Sensors, Sensor Systems, and Sensor Data Processing , O.  Loffeld, ed., Proc. SPIE 3100, 156–165(1997).
  7. E.  Schubert, “Fast 3-D object recognition using multiple color coded illumination,” in Proceedings of IEEE International Conference on Acoustics, Speech, and Signal Processing (Institute of Electrical and Electronics Engineers, New York, 1997), pp. 3057–3060.
  8. D.  Caspi, N.  Kiryati, J.  Shamir, “Range imaging with adaptive color structured light,” IEEE Trans. Pattern Analysis and Machine Intelligence 20, 470–480 (1998). [CrossRef]
  9. C.  Lu, S.  Inokuchi, “Intensity-Modulated Moiré Topography,” App. Opt. 38, 4019–4029(1999). [CrossRef]
  10. H.  Hioki, “Adaptive light projection and highlight analysis method for measuring three-dimensional scenes,” in Proceedings of IEEE International Conference on Image Processing (Institute of Electrical and Electronics Engineers, New York, 2000), 1, pp. 565–568.
  11. G. H.  Notni, P.  Kühmstedt, M.  Heinze, G.  Notni, “Method for Simultaneous Measurement of 3-D Shape and Color Information of Complex Objects,” in Proceedings of the International Symposium on Photonics in Measurement , T.  Pfeifer, W.  Holzapfel, eds. (Aachen, Germany, 2002), pp. 293–298.
  12. G.  Sansoni, L.  Biancardi, U.  Minoni, F.  Docchio, “A Novel, Adaptive System for 3-D Optical Profilometry Using a Liquid Crystal Light Projector,” IEEE Trans. Instrumentation and Measurement 43, 558–565 (1994). [CrossRef]
  13. X.  Zhao, T.  Suzuki, O.  Sasaki, “Photothermal Phase-Modulating Laser Diode Interferometer with High-Speed Feedback Control,” Opt. Rev. 9, 13–17 (2002). [CrossRef]
  14. C.  Lu, G.  Cho, J.  Zhao, “Practical 3-D Image Measurement System using Monochrome-Projection Color-Analysis Technique,” in Proceedings of the 7th IASTED International Conference on computer graphics and imaging , M. H.  Hamza, ed. (Hawaii, USA, 2004), pp. 254–259.
  15. C.  Lu, L.  Xiang, “Optimal Intensity-Modulation Projection Technique for Three-Dimensional Shape Measurement,” App. Optics-IP, 42, 4649–4657 (2003). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Multimedia

Multimedia FilesRecommended Software
» Media 1: GIF (129 KB)     

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited