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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 12 — Jun. 13, 2005
  • pp: 4492–4506

Three-dimensional imaging and recognition of microorganism using single-exposure on-line (SEOL) digital holography

Bahram Javidi, Inkyu Moon, Seokwon Yeom, and Edward Carapezza  »View Author Affiliations


Optics Express, Vol. 13, Issue 12, pp. 4492-4506 (2005)
http://dx.doi.org/10.1364/OPEX.13.004492


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Abstract

We address three-dimensional (3D) visualization and recognition of microorganisms using single-exposure on-line (SEOL) digital holography. A coherent 3D microscope-based Mach-Zehnder interferometer records a single on-line Fresnel digital hologram of microorganisms. Three-dimensional microscopic images are reconstructed numerically at different depths by an inverse Fresnel transformation. For recognition, microbiological objects are segmented by processing the background diffraction field. Gabor-based wavelets extract feature vectors with multi-oriented and multi-scaled Gabor kernels. We apply a rigid graph matching (RGM) algorithm to localize predefined shape features of biological samples. Preliminary experimental and simulation results using sphacelaria alga and tribonema aequale alga microorganisms are presented. To the best of our knowledge, this is the first report on 3D visualization and recognition of microorganisms using on-line digital holography with single-exposure.

© 2005 Optical Society of America

OCIS Codes
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(090.2880) Holography : Holographic interferometry
(100.5010) Image processing : Pattern recognition
(100.6890) Image processing : Three-dimensional image processing

ToC Category:
Research Papers

History
Original Manuscript: April 21, 2005
Revised Manuscript: May 23, 2005
Published: June 13, 2005

Citation
Bahram Javidi, Inkyu Moon, Seokwon Yeom, and Edward Carapezza, "Three-dimensional imaging and recognition of microorganism using single-exposure on-line (SEOL) digital holography," Opt. Express 13, 4492-4506 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-12-4492


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