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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 13 — Jun. 27, 2005
  • pp: 5170–5178

Characterization of UV written waveguides with luminescence microscopy

Mikael Svalgaard, Anders Harpøth, and Tue Rosbirk  »View Author Affiliations


Optics Express, Vol. 13, Issue 13, pp. 5170-5178 (2005)
http://dx.doi.org/10.1364/OPEX.13.005170


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Abstract

Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 µm and high signal-to-noise ratio. The measurements reveal complex waveguide formation dynamics with significant topological changes in the core profile. In addition, it is observed that the waveguide formation process requires several milliseconds of UV exposure before starting.

© 2005 Optical Society of America

OCIS Codes
(130.3130) Integrated optics : Integrated optics materials
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:
Research Papers

History
Original Manuscript: April 29, 2005
Revised Manuscript: June 21, 2005
Published: June 27, 2005

Citation
Mikael Svalgaard, Anders Harpøth, and Tue Rosbirk, "Characterization of UV written waveguides with luminescence microscopy," Opt. Express 13, 5170-5178 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-13-5170


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