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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 14 — Jul. 11, 2005
  • pp: 5416–5423

On the origin of internal field in Lithium Niobate crystals directly observed by digital holography

Melania Paturzo, Pietro Ferraro, Simonetta Grilli, Domenico Alfieri, Paolo De Natale, Marella de Angelis, Andrea Finizio, Sergio De Nicola, Giovanni Pierattini, Federico Caccavale, David Callejo, and Alessandro Morbiato  »View Author Affiliations

Optics Express, Vol. 13, Issue 14, pp. 5416-5423 (2005)

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We show the defect dependence of the internal field in Lithium Niobate using a full-field interferometric method and demonstrate that it can be directly measured on some clusters of defects embedded in a stoichiometric matrix. Results show that the value of the internal field grows in proximity of defects and vanishes far from them, which addresses the long-standing issue about its origin in Lithium Niobate crystal.

© 2005 Optical Society of America

OCIS Codes
(090.0090) Holography : Holography
(100.3010) Image processing : Image reconstruction techniques
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(160.2100) Materials : Electro-optical materials
(160.3730) Materials : Lithium niobate

ToC Category:
Research Papers

Original Manuscript: May 16, 2005
Revised Manuscript: June 27, 2005
Published: July 11, 2005

Melania Paturzo, Pietro Ferraro, Simonetta Grilli, Domenico Alfieri, Paolo De Natale, Marcella de Angelis, Andrea Finizio, Sergio De Nicola, Giovanni Pierattini, Federico Caccavale, David Callejo, and Alessandro Morbiato, "On the origin of internal field in Lithium Niobate crystals directly observed by digital holography," Opt. Express 13, 5416-5423 (2005)

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