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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 16 — Aug. 8, 2005
  • pp: 6296–6304

X-ray phase imaging with a grating interferometer

Timm Weitkamp, Ana Diaz, Christian David, Franz Pfeiffer, Marco Stampanoni, Peter Cloetens, and Eric Ziegler  »View Author Affiliations


Optics Express, Vol. 13, Issue 16, pp. 6296-6304 (2005)
http://dx.doi.org/10.1364/OPEX.13.006296


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Abstract

Using a high-efficiency grating interferometer for hard X rays (10–30 keV) and a phase-stepping technique, separate radiographs of the phase and absorption profiles of bulk samples can be obtained from a single set of measurements. Tomographic reconstruction yields quantitative three-dimensional maps of the X-ray refractive index, with a spatial resolution down to a few microns. The method is mechanically robust, requires little spatial coherence and monochromaticity, and can be scaled up to large fields of view, with a detector of correspondingly moderate spatial resolution. These are important prerequisites for use with laboratory X-ray sources.

© 2005 Optical Society of America

OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
Research Papers

History
Original Manuscript: June 27, 2005
Revised Manuscript: August 1, 2005
Published: August 8, 2005

Citation
Timm Weitkamp, Ana Diaz, Christian David, Franz Pfeiffer, Marco Stampanoni, Peter Cloetens, and Eric Ziegler, "X-ray phase imaging with a grating interferometer," Opt. Express 13, 6296-6304 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-16-6296


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References

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