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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 17 — Aug. 22, 2005
  • pp: 6376–6380

Recent progress in improving low-temperature stability of infrared thin-film interference filters

B. Li, S. Y. Zhang, J. C. Jiang, D. Q. Liu, and F. S. Zhang  »View Author Affiliations

Optics Express, Vol. 13, Issue 17, pp. 6376-6380 (2005)

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The degeneration of performance of an optical thin-film interference filter associated with the change of temperature is not acceptable. In this letter, we report a new progress in improving low-temperature performance of infrared narrow-band filters by using Pb1-xGexTe initial bulk alloy with appropriate Ge concentration x. It can be found that there exists a critical temperature for the investigated narrowband filter, at which the temperature coefficient of filter is exactly zero. Therefore, by means of controlling the composition in (Pb1-xGex)1-yTey layers, the temperature coefficient of filter can be tunable at the designated low-temperature. In our present investigation, when temperature varies from 300 to 85 K, a shift of peak wavelength of 0.05935 nm.K-1 has been achieved.

© 2005 Optical Society of America

OCIS Codes
(120.2440) Instrumentation, measurement, and metrology : Filters
(160.2260) Materials : Ferroelectrics
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Research Papers

Original Manuscript: July 15, 2005
Revised Manuscript: August 4, 2005
Published: August 22, 2005

B. Li, S. Zhang, J. Jiang, D. Q. Liu, and F. Zhang, "Recent progress in improving low-temperature stability of infrared thin-film interference filters," Opt. Express 13, 6376-6380 (2005)

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