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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 18 — Sep. 5, 2005
  • pp: 6833–6847

Vectorial, high numerical aperture study of Nomarski�??s differential interference contrast microscope

Peter Munro and Peter Török  »View Author Affiliations

Optics Express, Vol. 13, Issue 18, pp. 6833-6847 (2005)

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It is well known that vectorial analysis is essential to the study of high numerical aperture (NA) bright field scanning microscopes. We have constructed a high NA, vectorial model of a scanned Di.erential Interference Contrast (DIC) microscope which demonstrates that vectorial analysis is even more important to the study of this device. Our model is valid for coherent illumination and is able to model arbitrary scattering objects through the application of rigorous numerical methods for calculating electromagnetic scattering. We use our model to demonstrate how parameters such as sheer and bias a.ect imaging properties of both confocal and conventional scanning type DIC microscopes.

© 2005 Optical Society of America

OCIS Codes
(050.1960) Diffraction and gratings : Diffraction theory
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.0180) Microscopy : Microscopy
(260.2110) Physical optics : Electromagnetic optics

ToC Category:
Research Papers

Original Manuscript: July 7, 2005
Revised Manuscript: August 17, 2005
Published: September 5, 2005

Peter Munro and Peter Török, "Vectorial, high numerical aperture study of Nomarski�??s differential interference contrast microscope," Opt. Express 13, 6833-6847 (2005)

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