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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 20 — Oct. 3, 2005
  • pp: 7905–7912

Intracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diode

Yu-Ping Lan, Yea-Feng Lin, Yu-Tai Li, Ru-Pin Pan, Chao-Kuei Lee, and Ci-Ling Pan  »View Author Affiliations


Optics Express, Vol. 13, Issue 20, pp. 7905-7912 (2005)
http://dx.doi.org/10.1364/OPEX.13.007905


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Abstract

The gap of a planar-aligned liquid crystal (LC) cell is measured by a novel method: Monitoring the change in output wavelength of an external-cavity diode laser by varying the voltage driving the LC cell placed in the laser cavity. This method is particularly suitable for measurement of LC cells of small phase retardation. Measurement errors of ±0.5 % and ±0.6 % for 9.6-μm and 4.25-μm cells with phase retardations of 1.63 μm and 0.20 μm respectively are demonstrated.

© 2005 Optical Society of America

OCIS Codes
(120.2040) Instrumentation, measurement, and metrology : Displays
(140.2020) Lasers and laser optics : Diode lasers
(140.3410) Lasers and laser optics : Laser resonators
(140.3600) Lasers and laser optics : Lasers, tunable
(140.5960) Lasers and laser optics : Semiconductor lasers
(160.3710) Materials : Liquid crystals

ToC Category:
Research Papers

History
Original Manuscript: June 13, 2005
Revised Manuscript: September 2, 2005
Published: October 3, 2005

Citation
Yu-Ping Lan, Yea-Feng Lin, Yu-Tai Li, Ru-Pin Pan, Chao-Kuei Lee, and Ci-Ling Pan, "Intracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diode," Opt. Express 13, 7905-7912 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-20-7905


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References

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