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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 20 — Oct. 3, 2005
  • pp: 8214–8221

Rapid wavelength-swept spectrally encoded confocal microscopy

C. Boudoux, S. H. Yun, W. Y. Oh, W. M. White, N. V. Iftimia, M. Shishkov, B. E. Bouma, and G. J. Tearney  »View Author Affiliations


Optics Express, Vol. 13, Issue 20, pp. 8214-8221 (2005)
http://dx.doi.org/10.1364/OPEX.13.008214


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Abstract

Spectrally encoded confocal microscopy (SECM) is a technique that allows confocal microscopy to be performed through the confines of a narrow diameter optical fiber probe. We present a novel scheme for performing SECM in which a rapid wavelength swept source is used. The system allows large field of view images to be acquired at rates up to 30 frames/second. Images of resolution targets and tissue specimens acquired ex vivo demonstrate high lateral (1.4 μm) and axial (6 μm) resolution. Imaging of human skin was performed in vivo at depths of up to 350 μm, allowing cellular and sub-cellular details to be visualized in real time.

© 2005 Optical Society of America

OCIS Codes
(170.0110) Medical optics and biotechnology : Imaging systems
(180.1790) Microscopy : Confocal microscopy

ToC Category:
Research Papers

History
Original Manuscript: August 22, 2005
Revised Manuscript: September 23, 2005
Published: October 3, 2005

Citation
C. Boudoux, S. Yun, W. Oh, W. White, N. Iftimia, M. Shishkov, B. Bouma, and G. Tearney, "Rapid wavelength-swept spectrally encoded confocal microscopy," Opt. Express 13, 8214-8221 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-20-8214


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