OSA's Digital Library

Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 22 — Oct. 31, 2005
  • pp: 8913–8920

Measurement of the spectrally-resolved absolute phase difference between orthogonal optical modes using a nonlinear beat signal

Anastassia Gosteva, Markus Haiml, and Ursula Keller  »View Author Affiliations

Optics Express, Vol. 13, Issue 22, pp. 8913-8920 (2005)

View Full Text Article

Enhanced HTML    Acrobat PDF (209 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



On the basis of white-light interferometry with spectrally integrated detection and Fourier transform (FT) analysis, we demonstrate a novel technique for measuring the spectrally-resolved absolute phase difference between orthogonal optical modes with milliradian precision. The phase difference is evaluated from a nonlinear beat signal, occurring in the phase spectrum when independent interferograms, formed by individual modes, are recorded simultaneously. Although scanning white-light FT interferometry is a linear technique in general, the nonlinear beat signal is due to spectral amplitude variations in each mode. These proof-of-principle absolute phase difference measurements were carried out with polarization and spatial fiber modes.

© 2005 Optical Society of America

OCIS Codes
(070.2590) Fourier optics and signal processing : ABCD transforms
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Research Papers

Original Manuscript: August 10, 2005
Revised Manuscript: October 18, 2005
Published: October 31, 2005

Anastassia Gosteva, Markus Haiml, and Ursula Keller, "Measurement of the spectrally-resolved absolute phase difference between orthogonal optical modes using a nonlinear beat signal," Opt. Express 13, 8913-8920 (2005)

Sort:  Journal  |  Reset  


  1. M. Born and E. Wolf, Principles of Optics. (U. K.: Pergamon, London, 1984).
  2. R.M.A. Azzam and N.M. Bashara, Ellipsometry and Polarized Light. (North-Holland, Amsterdam, 1987).
  3. K. Naganuma, K. Mogi, and H. Yamada, "Group-delay measurement using the Fourier transform of an interferometric cross correlation generated by white light," Opt. Lett. 15, 393-395 (1990). [CrossRef] [PubMed]
  4. M. Beck and I. A. Walmsley, "Measuring of group delay with high temporal and spectral resolution," Opt. Lett. 15, 492-496 (1990). [CrossRef] [PubMed]
  5. A. P. Kovacs, K. Osvay, Zs. Bor, and R. Szipocs, "Group-delay measurement on laser mirrors by spectrally resolved white-light interferometry," Opt. Lett. 20, 788- 790 (1995). [CrossRef] [PubMed]
  6. C. Iaconis and I. A. Walmsley, "Spectral Phase Interferometry for Direct Electric Field Reconstruction of Ultrashort Optical Pulses," Opt. Lett. 23, 792-794 (1998). [CrossRef]
  7. I. A. Walmsley, L. Waxer, and C. Dorrer, "The role of dispersion in optics," Rev. Sci. Instrum. 72, 1-29 (2001). [CrossRef]
  8. A. Gosteva, M. Haiml, R. Paschotta, and U. Keller, "Noise-related resolution limit of dispersion measurements with white-light interferometers," J. Opt. Soc. Am B 22, 1868-1874 (2005). [CrossRef]
  9. P. Pavlicek and G. Hausler,"White-light interferometer with dispersion: an accurate fiber-optic sensor for the measurement of distance," Appl. Opt. 44, 2978-2983 (2005). [CrossRef] [PubMed]
  10. K. Oka and T. Kato, "Spectroscopic polarimetry with a channeled spectrum," Opt. Lett. 24, 1475-1477 (1999). [CrossRef]
  11. G. Nomarski, "A double-shear differential interferometer using birefringent beamsplitter," Jap. J. Appl. Phys. 14, 363-368 (1975).
  12. H. K. Heinrich, D. M. Bloom, and B. R. Hemenway, "Noninvasive sheet charge density probe for integrated silicon devices," Appl. Phys. Lett. 48, 1066-1068 (1986). [CrossRef]
  13. U. Keller, S. K. Diamond, B. A. Auld, and D. M. Bloom, "A noninvasive optical probe of free charge and applied voltage in GaAs devices," Appl. Phys. Lett. 53, 388-390 (1988). [CrossRef]
  14. Mitsuo Takeda, Hideki Ina, and Seiji Kobayashi, "Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry," J. Opt. Soc. Am. B 72, 156-160 (1982). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Supplementary Material

» Media 1: GIF (39 KB)     
» Media 2: GIF (74 KB)     

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited