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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 22 — Oct. 31, 2005
  • pp: 9023–9028

Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique

B. C. Gibson, S. T. Huntington, S. Rubanov, P. Olivero, K. Digweed-Lyytikäinen, J. Canning, and J. D. Love  »View Author Affiliations

Optics Express, Vol. 13, Issue 22, pp. 9023-9028 (2005)

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This paper presents a technique to expose and characterize nano-structured hole arrays in tapered photonic crystal fibers. Hole array structures are examined with taper outer diameters ranging from 12.9 μm to 1.6 μm. A combined focused ion beam milling and scanning electron microscope system was used to expose and characterize the arrayed air-silica structures. Results from this combined technique are presented which resolve hole-to-hole pitch sizes and hole diameters in the order of 120 nm and 60 nm, respectively.

© 2005 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2310) Fiber optics and optical communications : Fiber optics
(060.2350) Fiber optics and optical communications : Fiber optics imaging
(140.3470) Lasers and laser optics : Lasers, carbon dioxide
(180.5810) Microscopy : Scanning microscopy

ToC Category:
Research Papers

Original Manuscript: August 23, 2005
Revised Manuscript: October 19, 2005
Published: October 31, 2005

B. Gibson, S. Huntington, S. Rubanov, P. Olivero, K. Digweed-Lyytikäinen, J. Canning, and J. Love, "Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique," Opt. Express 13, 9023-9028 (2005)

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