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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 22 — Oct. 31, 2005
  • pp: 9052–9061

Theoretical derivation of the depth average of remotely sensed optical parameters

J. Ronald V. Zaneveld, Andrew H. Barnard, and Emmanuel Boss  »View Author Affiliations


Optics Express, Vol. 13, Issue 22, pp. 9052-9061 (2005)
http://dx.doi.org/10.1364/OPEX.13.009052


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Abstract

The dependence of the reflectance at the surface on the vertical structure of optical parameters is derived from first principles. It is shown that the depth dependence is a function of the derivative of the round trip attenuation of the downwelling and backscattered light. Previously the depth dependence was usually modeled as being dependent on the round trip attenuation. Using the new relationship one can calculate the contribution of the mixed layer to the overall reflectance at the surface. This allows one to determine whether or not to ignore the vertical structure at greater depth. It is shown that the important parameter to average is the ratio of the backscattering and absorption coefficients. The surface reflectance is related to the weighted average of this parameter, not the ratio of the weighted average of the backscattering and the weighted average of the absorption. Only in the special case of “optical homogeneity” where the ratio of the backscattering and absorption coefficients does not vary with depth, can the vertical structure be ignored. Other special cases including constant backscattering and variable absorption are also investigated.

© 2005 Optical Society of America

OCIS Codes
(010.4450) Atmospheric and oceanic optics : Oceanic optics
(280.0280) Remote sensing and sensors : Remote sensing and sensors

ToC Category:
Research Papers

History
Original Manuscript: September 15, 2005
Revised Manuscript: October 20, 2005
Published: October 31, 2005

Citation
J. Ronald Zaneveld, Andrew Barnard, and Emmanuel Boss, "Theoretical derivation of the depth average of remotely sensed optical parameters," Opt. Express 13, 9052-9061 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-22-9052


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