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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 25 — Dec. 12, 2005
  • pp: 10061–10065

Picometer displacement sensing using the ultrahigh-order modes in a submillimeter scale optical waveguide

Fan Chen, Zhuangqi Cao, Qishun Shen, Xiaoxu Deng, Biming Duan, Wen Yuan, Minghuang Sang, and Shengqian Wang  »View Author Affiliations


Optics Express, Vol. 13, Issue 25, pp. 10061-10065 (2005)
http://dx.doi.org/10.1364/OPEX.13.010061


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Abstract

An improved scheme for displacement measurement using the ultrahigh-order guided modes in a symmetrical metal-cladding optical waveguide is proposed. Based on this idea together with the lock-in amplification technique, a sensor with a stable displacement resolution of 3.3 pm is experimentally demonstrated without any complicated servo system.

© 2005 Optical Society of America

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(230.7390) Optical devices : Waveguides, planar

ToC Category:
Research Papers

Citation
Fan Chen, Zhuangqi Cao, Qishun Shen, Xiaoxu Deng, Biming Duan, Wen Yuan, Minghuang Sang, and Shengqian Wang, "Picometer displacement sensing using the ultrahigh-order modes in a submillimeter scale optical waveguide," Opt. Express 13, 10061-10065 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-25-10061


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References

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