Picometer displacement sensing using the ultrahigh-order modes in a submillimeter scale optical waveguide
Optics Express, Vol. 13, Issue 25, pp. 10061-10065 (2005)
http://dx.doi.org/10.1364/OPEX.13.010061
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Abstract
An improved scheme for displacement measurement using the ultrahigh-order guided modes in a symmetrical metal-cladding optical waveguide is proposed. Based on this idea together with the lock-in amplification technique, a sensor with a stable displacement resolution of 3.3 pm is experimentally demonstrated without any complicated servo system.
© 2005 Optical Society of America
OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(230.7390) Optical devices : Waveguides, planar
ToC Category:
Research Papers
Citation
Fan Chen, Zhuangqi Cao, Qishun Shen, Xiaoxu Deng, Biming Duan, Wen Yuan, Minghuang Sang, and Shengqian Wang, "Picometer displacement sensing using the ultrahigh-order modes in a submillimeter scale optical waveguide," Opt. Express 13, 10061-10065 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-25-10061
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