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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 25 — Dec. 12, 2005
  • pp: 10075–10084

Analyzing integrated circuits at work with a picosecond time-gated imager

D. Comelli, C. D’Andrea, G. Valentini, R. Cubeddu, R. Casiraghi, and D. Cantarelli  »View Author Affiliations

Optics Express, Vol. 13, Issue 25, pp. 10075-10084 (2005)

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A system based on a picosecond time-gated image intensifier is proposed for non-contact testing of CMOS circuits. The apparatus allows one to record the temporal evolution of the luminescence emitted during transistor switching as a function of the position inside the chip. The system is characterized by an intrinsic parallelism in the spatial dimensions. This feature is noticeable for studying wide sections of complex circuits, like microprocessors and random access memories, where multiple electrical events occur simultaneously. Experiments on a CMOS inverter chain and on a static memory have been carried out, in order to demonstrate the applicability of a picosecond time-gated imager to circuit analysis.

© 2005 Optical Society of America

OCIS Codes
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(260.3800) Physical optics : Luminescence

ToC Category:
Research Papers

D. Comelli, C. D'Andrea, G. Valentini, R. Cubeddu, R. Casiraghi, and D. Cantarelli, "Analyzing integrated circuits at work with a picosecond time-gated imager," Opt. Express 13, 10075-10084 (2005)

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