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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 26 — Dec. 26, 2005
  • pp: 10854–10864

Elimination of polarized light scattered by surface roughness or bulk heterogeneity

Claude Amra, Carole Deumie, and Olivier Gilbert  »View Author Affiliations


Optics Express, Vol. 13, Issue 26, pp. 10854-10864 (2005)
http://dx.doi.org/10.1364/OPEX.13.010854


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Abstract

An interferential technique is described to eliminate polarized scattering from optical substrates and coatings. Conditions of annulment are respectively given for surface roughness and for bulk heterogeneity, at each direction of space. At low-level scattering, the method offers a complete discrimination of surface and bulk effects, whatever the micro-structural parameters. Arbitrary scattering levels can be treated in a similar way, but require the knowledge of microstructure.

© 2005 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(240.0240) Optics at surfaces : Optics at surfaces
(240.5770) Optics at surfaces : Roughness
(290.5880) Scattering : Scattering, rough surfaces
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Research Papers

Citation
Claude Amra, Carole Deumie, and Olivier Gilbert, "Elimination of polarized light scattered by surface roughness or bulk heterogeneity," Opt. Express 13, 10854-10864 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-26-10854


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References

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