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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 3 — Feb. 7, 2005
  • pp: 1015–1024

En-face scanning optical coherence tomography with ultra-high resolution for material investigation

Karin Wiesauer, Michael Pircher, Erich Götzinger, Siegfried Bauer, Rainer Engelke, Gisela Ahrens, Gabi Grützner, Christoph K. Hitzenberger, and David Stifter  »View Author Affiliations

Optics Express, Vol. 13, Issue 3, pp. 1015-1024 (2005)

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Optical coherence tomography (OCT) is an emerging technique for cross-sectional imaging, originally developed for biological structures. When OCT is employed for material investigation, high-resolution and short measurement times are required, and for many applications, only transversal (en-face) scans yield substantial information which cannot be obtained from cross-sectional images oriented perpendicularly to the sample surface alone. In this work, we combine transversal with ultra-high resolution OCT: a broadband femto-second laser is used as a light source in combination with acousto-optic modulators for heterodyne signal generation and detection. With our setup we are able to scan areas as large as 3×3 mm2 with a sensitivity of 100 dB, representing areas 100 times larger compared to other high-resolution en-face OCT systems (full field). We demonstrate the benefits of en-face scanning for different applications in materials investigation.

© 2005 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(140.7090) Lasers and laser optics : Ultrafast lasers
(230.1040) Optical devices : Acousto-optical devices

ToC Category:
Research Papers

Original Manuscript: December 17, 2004
Revised Manuscript: January 31, 2005
Published: February 7, 2005

Karin Wiesauer, Michael Pircher, Erich Götzinger, Siegfried Bauer, Rainer Engelke, Gisela Ahrens, Gabi Grützner, Christoph Hitzenberger, and David Stifter, "En-face scanning optical coherence tomography with ultra-high resolution for material investigation," Opt. Express 13, 1015-1024 (2005)

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