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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 3 — Feb. 7, 2005
  • pp: 1025–1032

A large-depth-of-field projected fringe profilometry using supercontinuum light illumination

Wei-Hung Su, Kebin Shi, Zhiwen Liu, Bo Wang, Karl Reichard, and Shizhuo Yin  »View Author Affiliations

Optics Express, Vol. 13, Issue 3, pp. 1025-1032 (2005)

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In this paper, a large-depth-of-field projected fringe profilometry using a supercontinuum light source generated by launching femto second laser pulses into a highly nonlinear photonic crystal fiber is presented. Since the supercontinuum light has high spatial coherence and a broad spectral range (from UV to near infrared), a high power (hundreds of mW) point white light source can be employed to generate modulated fringe patterns, which offers following major advantages: (1) large-depth-of-field, (2) ease of calibration, and (3) little speckle noise (a major problem for the laser system). Thus, a highly accurate, large-depth-of-field projected fringe profilometer can be realized. Both the theoretical description and experimental demonstration are provided.

© 2005 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4630) Instrumentation, measurement, and metrology : Optical inspection

ToC Category:
Research Papers

Original Manuscript: January 5, 2005
Revised Manuscript: January 31, 2005
Published: February 7, 2005

Wei-Hung Su, Kebin Shi, Zhiwen Liu, Bo Wang, Karl Reichard, and Shizhuo Yin, "A large-depth-of-field projected fringe profilometry using supercontinuum light illumination," Opt. Express 13, 1025-1032 (2005)

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