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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 6 — Mar. 21, 2005
  • pp: 2047–2057

Refractive indices of Sn2P2S6 at visible and infrared wavelengths

D. Haertle, A. Guarino, J. Hajfler, G. Montemezzani, and P. Günter  »View Author Affiliations


Optics Express, Vol. 13, Issue 6, pp. 2047-2057 (2005)
http://dx.doi.org/10.1364/OPEX.13.002047


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Abstract

We report on the refractive indices of Sn2P2S6 crystals in the wavelength range 550–2300 nm. The measurements are performed at room temperature using the minimum deviation method. The dispersion is described by a two oscillator model yielding the oscillator energies and strengths (Sellmeier parameters) for all polarization directions. The rotation of the indicatrix in the mirror plane and the direction of the optical axes have also been determined in the wavelength range λ=550-2200 nm.

© 2005 Optical Society of America

OCIS Codes
(120.5710) Instrumentation, measurement, and metrology : Refraction
(160.5320) Materials : Photorefractive materials

ToC Category:
Research Papers

History
Original Manuscript: November 24, 2004
Revised Manuscript: March 7, 2005
Published: March 21, 2005

Citation
D. Haertle, A. Guarino, J. Hajfler, G. Montemezzani, and P. Günter, "Refractive indices of Sn2P2S6 at visible and infrared wavelengths," Opt. Express 13, 2047-2057 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-6-2047


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References

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