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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 6 — Mar. 21, 2005
  • pp: 2160–2175

Multi-aperture Fourier transform imaging spectroscopy: theory and imaging properties

Samuel T. Thurman and James R. Fienup  »View Author Affiliations


Optics Express, Vol. 13, Issue 6, pp. 2160-2175 (2005)
http://dx.doi.org/10.1364/OPEX.13.002160


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Abstract

Fourier transform imaging spectroscopy (FTIS) can be performed with a multi-aperture optical system by making a series of intensity measurements, while introducing optical path differences (OPD’s) between various subapertures, and recovering spectral data by the standard Fourier post-processing technique. The imaging properties for multi-aperture FTIS are investigated by examining the imaging transfer functions for the recovered spectral images. For systems with physically separated subapertures, the imaging transfer functions are shown to vanish necessarily at the DC spatial frequency. Also, it is shown that the spatial frequency coverage of particular systems may be improved substantially by simultaneously introducing multiple OPD’s during the measurements, at the expense of limiting spectral coverage and causing the spectral resolution to vary with spatial frequency.

© 2005 Optical Society of America

OCIS Codes
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(110.2990) Imaging systems : Image formation theory
(110.4850) Imaging systems : Optical transfer functions
(110.6770) Imaging systems : Telescopes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Research Papers

History
Original Manuscript: January 5, 2005
Revised Manuscript: March 10, 2005
Published: March 21, 2005

Citation
Samuel Thurman and James Fienup, "Multi-aperture Fourier transform imaging spectroscopy: theory and imaging properties," Opt. Express 13, 2160-2175 (2005)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-13-6-2160


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