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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 13, Iss. 7 — Apr. 4, 2005
  • pp: 2487–2502

Statistical analysis of geometrical imperfections from the images of 2D photonic crystals

Maksim Skorobogatiy, Guillaume Bégin, and Anne Talneau  »View Author Affiliations

Optics Express, Vol. 13, Issue 7, pp. 2487-2502 (2005)

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High resolution images of planar photonic crystal (PC) optical components fabricated by e-beam lithography in various materials are analyzed to characterize statistical properties of common 2D geometrical imperfections. Our motivation is to attempt an intuitive, while rigorous statistical description of fabrication imperfections to provide a realistic input into theoretical modelling of PC device performance.

© 2005 Optical Society of America

OCIS Codes
(030.5770) Coherence and statistical optics : Roughness
(100.2960) Image processing : Image analysis
(100.5010) Image processing : Pattern recognition
(130.1750) Integrated optics : Components
(130.3120) Integrated optics : Integrated optics devices

ToC Category:
Research Papers

Original Manuscript: January 31, 2005
Revised Manuscript: March 17, 2005
Published: April 4, 2005

Maksim Skorobogatiy, Guillaume Bégin, and Anne Talneau, "Statistical analysis of geometrical imperfections from the images of 2D photonic crystals," Opt. Express 13, 2487-2502 (2005)

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