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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 1 — Jan. 9, 2006
  • pp: 120–127

Optical vortex metrology for nanometric speckle displacement measurement

Wei Wang, Tomoaki Yokozeki, Reika Ishijima, Atsushi Wada, Yoko Miyamoto, Mitsuo Takeda, and Steen G. Hanson  »View Author Affiliations

Optics Express, Vol. 14, Issue 1, pp. 120-127 (2006)

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As an alternative to correlation-based techniques widely used in conventional speckle metrology, we propose a new technique that makes use of phase singularities in the complex analytic signal of a speckle pattern as indicators of local speckle displacements. The complex analytic signal is generated by vortex filtering the speckle pattern. Experimental results are presented that demonstrate the validity and the performance of the proposed optical vortex metrology with nano-scale resolution.

© 2006 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(100.5070) Image processing : Phase retrieval
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging

ToC Category:
Instrumentation, Measurement, and Metrology

Wei Wang, Tomoaki Yokozeki, Reika Ishijima, Atsushi Wada, Yoko Miyamoto, Mitsuo Takeda, and Steen G. Hanson, "Optical vortex metrology for nanometric speckle displacement measurement," Opt. Express 14, 120-127 (2006)

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